FM-Nanoview 6800 AFM Atomic Force Microscope

FM-Nanoview 6800 AFM Atomic Force Microscope

All-in-one design, smart structure and  shape.Scan head and sample stage are designed together, strong anti-vibration  performance .Precision laser detection and probe alignment device make laser  adjustment simple and easy.Adapt servomotor to drive the sample approaching tip  manually or automatically, to realize precision scanning area  positioning.High-accuracy and large range sample transfer device allow to scan  any interesting area of sample ;Different types of scanner meets different  customer’s requirements in accuracy and scan size;optical observation system for  tip check and sample positioning.CCD observing system for real-time sample area  observing and position;Use servomotor to achieve CCD auto-focusing Electronic  system is designed as modular and easy for maintenance and  development.Integrated with many working modes control electronics for further  development.

User-friendly software and  functions

1.Multi-channels images are capture and display  synchronous, observe profile map in real time.
2.Obtain and measure many  curves such as F-Z, f-RMS, RMS-Z
3.Execute scan area move and cut function,  choose any interesting area of sample.
4.Scan sample in random angle at  beginning.
5. Adjust the laser spot detection system in real time.
6.  Search the resonance frequency of tip manually or automatically.
7. Choose  and set different color of scanning image in palette.
8. Support linear  average and offset calibration in real time for sample title.
9. Support  scanner sensitivity calibration and electronic controller  auto-calibration.

Main technical parameters